WEKO3
インデックスリンク
アイテム
Defect Images by Planar ECT Probe of Meander-Mesh Coils
http://hdl.handle.net/2297/48344
http://hdl.handle.net/2297/48344b6d5f2b5-8d07-4cc0-83a2-8f3e1a781334
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
TE-PR-YAMADA-S-099.pdf (346.4 kB)
|
|
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2017-10-03 | |||||
| タイトル | ||||||
| タイトル | Defect Images by Planar ECT Probe of Meander-Mesh Coils | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| 著者 |
Yamada, Sotoshi
× Yamada, Sotoshi× Katou, M.× Iwahara, Masayoshi× Dawson, F.P. |
|||||
| 書誌情報 |
IEEE Transactions on Maggetics 巻 32, 号 6, p. 4956-4958, 発行日 1996-08-01 |
|||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0018-9464 | |||||
| NCID | ||||||
| 収録物識別子タイプ | NCID | |||||
| 収録物識別子 | AA00667933 | |||||
| DOI | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.1109/20.539300 | |||||
| 出版者 | ||||||
| 出版者 | Institute of Electrical and Electronics Engineers IEEE | |||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | This paper presents results pertaining to image data obtained from a planar meander-mesh coupled coil type ECT probe. The image data makes it possible to detect not only the existence of a defect but also to extract detailed information regarding the nature of the defect, such as its position, shape, length, and direction. In order to recognize a defect distinctly, we have fabricated the high sensitive planar coil which can be used to image a 2-D representation of the ECT signal. The relationships between the image pattern and defect shape are discussed. | |||||
| 権利 | ||||||
| 権利情報 | © 1996 IEEE. | |||||
| 著者版フラグ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
