{"_buckets": {"deposit": "c47be4d6-ca16-4818-95da-a2e383861683"}, "_deposit": {"created_by": 3, "id": "9325", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "9325"}, "status": "published"}, "_oai": {"id": "oai:kanazawa-u.repo.nii.ac.jp:00009325", "sets": ["936"]}, "author_link": ["399", "13387", "13388", "13386"], "item_4_biblio_info_8": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2009-01-01", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "11", "bibliographicPageEnd": "1304", "bibliographicPageStart": "1299", "bibliographicVolumeNumber": "75", "bibliographic_titles": [{"bibliographic_title": "精密工学会誌 = Journal of the Japan Society for Precision Engineering"}]}]}, "item_4_description_21": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "Vertical-scanning shape-measurement interferometry using white light is widely used to measure 3D shape of objects having step-like shape. This interferometry however cannot be used under vibrating environment. Because, it is required to accurately repeat predefined-step movements over vertical measurement range. We developed new technology which can measure the changes of optical path difference (OPD) of an interference microscope with nanometer resolution. This uses a line camera and a FPGA device and can measure OPD changes with around 20-μs interval. We built this technology onto a vertical-scanning interferometer and estimated performance of the developed technology using some vibration conditions.", "subitem_description_type": "Abstract"}]}, "item_4_publisher_17": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "精密工学会 = The Japan Society for Precision Engineering"}]}, "item_4_relation_12": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isIdenticalTo", "subitem_relation_type_id": {"subitem_relation_type_id_text": "10.2493/jjspe.75.1299", "subitem_relation_type_select": "DOI"}}]}, "item_4_relation_28": {"attribute_name": "関連URI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "https://www.jstage.jst.go.jp/browse/jjspe/-char/ja/", "subitem_relation_type_select": "URI"}}, {"subitem_relation_type_id": {"subitem_relation_type_id_text": "http://www.jspe.or.jp/", "subitem_relation_type_select": "URI"}}]}, "item_4_rights_23": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright © The Japan Society for Precision Engineering 精密工学会"}]}, "item_4_source_id_11": {"attribute_name": "NCID", "attribute_value_mlt": [{"subitem_source_identifier": "AN1003250X", "subitem_source_identifier_type": "NCID"}]}, "item_4_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0912-0289", "subitem_source_identifier_type": "ISSN"}]}, "item_4_version_type_25": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "安達, 正明"}], "nameIdentifiers": [{"nameIdentifier": "399", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "50212519", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://kaken.nii.ac.jp/ja/search/?qm=50212519"}, {"nameIdentifier": "50212519", "nameIdentifierScheme": "研究者番号", "nameIdentifierURI": "https://nrid.nii.ac.jp/nrid/1000050212519"}]}, {"creatorNames": [{"creatorName": "平野, 勇輝"}], "nameIdentifiers": [{"nameIdentifier": "13386", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "河村, 昌範"}], "nameIdentifiers": [{"nameIdentifier": "13387", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "岩尾, 雄太"}], "nameIdentifiers": [{"nameIdentifier": "13388", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2017-10-03"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "TE-PR-ADACHI-M-1299.pdf", "filesize": [{"value": "3.0 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 3000000.0, "url": {"label": "TE-PR-ADACHI-M-1299.pdf", "url": "https://kanazawa-u.repo.nii.ac.jp/record/9325/files/TE-PR-ADACHI-M-1299.pdf"}, "version_id": "7110d79e-c764-4405-b489-b71f0ea7bb5d"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "white-light interferometry", "subitem_subject_scheme": "Other"}, {"subitem_subject": "real-time measurement", "subitem_subject_scheme": "Other"}, {"subitem_subject": "vibration", "subitem_subject_scheme": "Other"}, {"subitem_subject": "phase", "subitem_subject_scheme": "Other"}, {"subitem_subject": "vertical scanning", "subitem_subject_scheme": "Other"}, {"subitem_subject": "nanometer", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "振動環境でも利用できる垂直走査型光干渉応用形状計測技術", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "振動環境でも利用できる垂直走査型光干渉応用形状計測技術"}, {"subitem_title": "Vertical-Scanning Shape-Measurement Interferometry Applicable under Vibrating Environment", "subitem_title_language": "en"}]}, "item_type_id": "4", "owner": "3", "path": ["936"], "permalink_uri": "http://hdl.handle.net/2297/42437", "pubdate": {"attribute_name": "公開日", "attribute_value": "2017-10-03"}, "publish_date": "2017-10-03", "publish_status": "0", "recid": "9325", "relation": {}, "relation_version_is_last": true, "title": ["振動環境でも利用できる垂直走査型光干渉応用形状計測技術"], "weko_shared_id": -1}